We will be very pleased to welcome you at the Stuttgart Exhibition Centre on June 22 – 24, 2010. See and experience the latest ETAS innovations for the development and testing of automotive embedded software!

06/14/2010

ETAS at Automotive Testing Expo 2010 in Stuttgart

We will be very pleased to welcome you at the Stuttgart Exhibition Centre on June 22 – 24, 2010.

See and experience the latest ETAS innovations for the development and testing of automotive embedded software:

  1. Guided Calibration with INCA
    • Reproducible setting of parameters and validation of automotive electronic systems by automating INCA with CaliAV®
    • Enhanced quality and efficiency in the calibration process
  2. Diagnostic Tree Builder - Sequence Editor supporting OTX Format and code output
    • Software tool for the intuitive, graphical generation of diagnostic test sequences in the early phases of development
    • Creation of diagnosis data for different tester systems in development, production and service
  3. ES400 Measurement Modules
    • Measurement modules for the acquisition of measurement signals close to sensors and for measuring in rough environments
    • Simple wiring scheme, powerful time-synchronous data acquisition
  4. PC-based testing of inverter ECUs for electric drives
    • High-performant and flexible closed-loop-simulation of battery and e-machine with off-the-shelf multicore PCs
    • Direct real-time coupling of ECU internal functions with the simulation model with Function-in-the-Loop (FiL)
    • New FPGA boards for extreme speed requirement

Please stop by our booth No 1642, building 1.

Furthermore you are cordially invited to visit our presentations during the „Open Technology Forum“:

  • High dynamic e-motor-HiL testing: PC-based vs. FPGA, Dr. Wolfgang Eismann
    Tuesday, 22 June 2010, 02:00 p.m., session „Simulation/Hardware-in-the-Loop“
  • A new approach for process-oriented and tool-based automation of calibration tasks for modern powertrain systems, Michael Vogel und Sven Maier (IAV)
    Wednesday, 23 June 2010, 11:05 a.m., Session “Measurement, Calibration, and Test Data Acquisition”

http://www.testing-expo.com/europe/german/forum.php?n=conf

To secure your admission tickets free of charge, feel free to register at
http://www.testing-expo.com/europe/german/visitor_pass.php

We are looking forward to your visit.